Worn 3D Probe Imager
From Seed
Revision as of 07:38, 23 June 2006; view current revision
←Older revision | Newer revision→
←Older revision | Newer revision→
| The 3-D Probe Imager uses structured light and x-ray techniques to perform deep scan analyses of hardware. |
[edit]
Tool
Base Value: 37964 AP | Damage Points: 100.0
| Function | Effect | Requirement |
| Cursory X-ray Probing | N/A | ? |
[edit]
Blueprint
| Base Value | Production Time | Production Cost (100%) | Factory Functions | Abilities | Components |
|---|---|---|---|---|---|
| 200 | 01:01:50 | 2968 |
